changes for requiredness relaxation, partial names, temperature_env o…

contributed_definitions/NXbeam_transfer_matrix_table.nxdl.xml

@@ -70,7 +70,7 @@
             <dim index="1" value="N_variables"/>
         </dimensions>
     </field>
-    <field name="TRANSFER_MATRIX" type="NX_NUMBER">
+    <field name="TRANSFER_MATRIX" type="NX_NUMBER" nameType="any">
         <doc>
             Contains the datastructure which relates beam properties of an
             input and output beam as result of the input beam interaction

contributed_definitions/NXellipsometry.nxdl.xml

@@ -147,21 +147,15 @@ This explicitly refers to a wish to add: "exposure time, number of scans"-->
             <doc>
                 Specify the type of ellipsometry.
             </doc>
-            <enumeration>
+            <enumeration open="true">
                 <item value="in situ spectroscopic ellipsometry"/>
                 <item value="THz spectroscopic ellipsometry"/>
                 <item value="infrared spectroscopic ellipsometry"/>
                 <item value="ultraviolet spectroscopic ellipsometry"/>
                 <item value="uv-vis spectroscopic ellipsometry"/>
                 <item value="NIR-Vis-UV spectroscopic ellipsometry"/>
-                <item value="other"/>
             </enumeration>
         </field>
-        <field name="ellipsometry_experiment_type_other" optional="true">
-            <doc>
-                If the ellipsometry_experiment_type is `other`, a name should be specified here.
-            </doc>
-        </field>
         <group type="NXinstrument">
             <doc>
                 Properties of the ellipsometry equipment.
@@ -170,7 +164,7 @@ This explicitly refers to a wish to add: "exposure time, number of scans"-->
                 <doc>
                     What type of ellipsometry was used? See Fujiwara Table 4.2.
                 </doc>
-                <enumeration>
+                <enumeration open="true">
                     <item value="rotating analyzer"/>
                     <item value="rotating analyzer with analyzer compensator"/>
                     <item value="rotating analyzer with polarizer compensator"/>
@@ -183,15 +177,8 @@ This explicitly refers to a wish to add: "exposure time, number of scans"-->
                     <item value="phase modulation"/>
                     <item value="imaging ellipsometry"/>
                     <item value="null ellipsometry"/>
-                    <item value="other"/>
                 </enumeration>
             </field>
-            <field name="ellipsometer_type_other" optional="true">
-                <doc>
-                    If the ellipsometer_type is `other`, a specific ellipsometry_type" should be
-                    added here.
-                </doc>
-            </field>
             <field name="rotating_element_type">
                 <doc>
                     Define which element rotates, e.g. polarizer or analyzer.
@@ -209,12 +196,11 @@ This explicitly refers to a wish to add: "exposure time, number of scans"-->
                     were corrected for the window effects.
                 </doc>
                 <field name="type">
-                    <enumeration>
+                    <enumeration open="true">
                         <item value="objective"/>
                         <item value="lens"/>
                         <item value="glass fiber"/>
                         <item value="none"/>
-                        <item value="other"/>
                     </enumeration>
                 </field>
                 <group name="device_information" type="NXfabrication" optional="true"/>

contributed_definitions/NXlens_opt.nxdl.xml

@@ -190,7 +190,7 @@ the lens has different coatings on the front and back side.-->
     </field>
     <field name="magnification" type="NX_FLOAT">
         <doc>
-
+            Magnification of the lens
         </doc>
     </field>
 </definition>

contributed_definitions/NXraman.nxdl.xml

@@ -78,60 +78,60 @@ dataset examples (i.e. NXdata_raman)-->
         <symbol name="N_scattering_configurations">
             <doc>
                 Number of scattering configurations used in the measurement.
-                It is 1 for only parallel polarization meausement, 2 for parallel and cross 
+                It is 1 for only parallel polarization meausement, 2 for parallel and cross
                 polarization measurement or larger, if i.e. the incident and scattered photon
                 direction is varied.
             </doc>
         </symbol>
     </symbols>
     <doc>
         An application definition for Raman spectrocopy experiments.
-        
+
         Such experiments may be as simple a single Raman spectrum from spontanous
         Raman scattering and range to Raman imaging Raman spectrometer,
         surface- and tip-enhanced Raman techniques, x-Ray Raman scattering, as well
         as resonant Raman scattering phenomena or multidimenional Raman spectra (i.e.
         varying temperature, pressure, electric field, ....)
-        
+
         The application definition contains two things:
         1. The structures in the application definition of NXopt:
         * Instrument and data calibrations
         * Sensors for sample or beam conditions
-          
+
         AND
-        
+
         2. The strucutres specified and extended in NXraman:
         * description of the experiment type
         * descroption of the setup's meta data and optical elements (source, monochromator, detector, waveplate, lens, etc.)
         * description of beam properties and their relations to the sample
         * sample information
-        
+
         Information on Raman spectroscopy are provided in:
-        
+
         General
-        
+
         * Lewis, Ian R.; Edwards, Howell G. M.
           Handbook of Raman Spectroscopy
           ISBN 0-8247-0557-2
-        
+
         Raman scattering selection rules
-        
+
         * Dresselhaus, M. S.; Dresselhaus, G.; Jorio, A.
           Group Theory - Application to the Physics ofCondensed Matter
           ISBN 3540328971
-        
+
         Semiconductors
-        
+
         * Manuel Cardona
           Light Scattering in Solids I
           eBook ISBN: 978-3-540-37568-5
           DOI: https://doi.org/10.1007/978-3-540-37568-5
-        
+
         * Manuel Cardona, Gernot Güntherodt
           Light Scattering in Solids II
           eBook ISBN:  978-3-540-39075-6
           DOI: https://doi.org/10.1007/3-540-11380-0
-        
+
         * See as well other Books from the "Light Scattering in Solids" series:
           III: Recent Results
           IV: Electronic Scattering, Spin Effects, SERS, and Morphic Effects
@@ -140,9 +140,9 @@ dataset examples (i.e. NXdata_raman)-->
           VII: Crystal-Field and Magnetic Excitations
           VIII: Fullerenes, Semiconductor Surfaces, Coherent Phonons
           IX: Novel Materials and Techniques
-        
+
         Glasses, Liquids, Gasses, ...
-        
+
         Review articles:
         Stimulated Raman scattering, Coherent anti-Stokes Raman scattering,
         Surface-enhanced Raman scattering, Tip-enhanced Raman scattering
@@ -173,7 +173,7 @@ dataset examples (i.e. NXdata_raman)-->
         <field name="experiment_type">
             <doc>
                 Specify the type of the optical experiment.
-                
+
                 You may specify fundamental characteristics or properties in the experimental sub-type.
             </doc>
             <enumeration>
@@ -184,7 +184,7 @@ dataset examples (i.e. NXdata_raman)-->
             <doc>
                 Specify the type of Raman experiment.
             </doc>
-            <enumeration>
+            <enumeration open="true">
                 <item value="in situ Raman spectroscopy"/>
                 <item value="resonant Raman spectroscopy"/>
                 <item value="non-resonant Raman spectroscopy"/>
@@ -196,15 +196,8 @@ dataset examples (i.e. NXdata_raman)-->
                 <item value="stimulated Raman spectroscopy (SRS)"/>
                 <item value="inverse Raman spectroscopy (IRS)"/>
                 <item value="coherent anti-Stokes Raman spectroscopy (CARS)"/>
-                <item value="other"/>
             </enumeration>
         </field>
-        <!--     enumeration: [in situ, resonant, non-resonant, imaging, tip-enhanced (TERS), surface-enhanced (SERS), surface plasmon polariton enhanced (SPPERS), hyper Raman spectroscopy (HRS), stimulated (SRS), inverse (IRS), coherent anti-Stokes (CARS), other]-->
-        <field name="raman_experiment_type_other" optional="true">
-            <doc>
-                If the raman_experiment_type is `other`, a name should be specified here.
-            </doc>
-        </field>
         <group type="NXinstrument">
             <doc>
                 Metadata of the setup, its optical elements and physical properites which
@@ -215,17 +208,17 @@ dataset examples (i.e. NXdata_raman)-->
                     Scattering configuration as defined by the porto notation by three
                     states, which are othogonal to each other. Example: z(xx)z for
                     parallel polarized backscattering configuration.
-                    
+
                     See:
                     https://www.cryst.ehu.es/cgi-bin/cryst/programs/nph-doc-raman
-                    
+
                     A(BC)D
-                    
+
                     A = The propagation direction of the incident light (k_i)
                     B = The polarization direction of the incident light (E_i)
                     C = The polarization direction of the scattered light (E_s)
                     D = The propagation direction of the scattered light (k_s)
-                    
+
                     An orthogonal base is assumed.
                     Linear polarized light is displayed by e.g. "x","y" or "z"
                     Unpolarized light is displayed by "."
@@ -235,11 +228,15 @@ dataset examples (i.e. NXdata_raman)-->
                     <doc>
                         Scattering configuration as defined by the porto notation given by
                         respective vectors.
-                        
+
                         Vectors in the porto notation are defined as for A, B, C, D above.
                         Linear light polarization is assumed.
                     </doc>
                     <dimensions rank="3">
+                        <doc>
+                            3 x 4 Matrix, which lists the porto notation vectors A, B, C, D.
+                            A has to be perpendicular to B and C perpendicular to D.
+                        </doc>
                         <dim index="1" value="4"/>
                         <dim index="2" value="3"/>
                         <dim index="3" value="N_scattering_configurations"/>

contributed_definitions/nyaml/NXbeam_transfer_matrix_table.yaml

@@ -36,6 +36,7 @@ NXbeam_transfer_matrix_table(NXobject):
       rank: 1
       dim: (N_variables,)
   TRANSFER_MATRIX(NX_NUMBER):
+    nameType: any
     doc: |
       Contains the datastructure which relates beam properties of an
       input and output beam as result of the input beam interaction
@@ -74,7 +75,7 @@ NXbeam_transfer_matrix_table(NXobject):
         Specific name of output beam which the transfermatrix table is related to.
 
 # ++++++++++++++++++++++++++++++++++ SHA HASH ++++++++++++++++++++++++++++++++++
-# 3c72efd3163790099d59b3bf6be34cc1057f31649bf49712963a10e0ae19e95b
+# 9940847e741800c15ace27c9433c59cef1d722790ee2710bef59ed4895a37d4d
 # <?xml version='1.0' encoding='UTF-8'?>
 # <?xml-stylesheet type="text/xsl" href="nxdlformat.xsl"?>
 # <!--
@@ -147,7 +148,7 @@ NXbeam_transfer_matrix_table(NXobject):
 #             <dim index="1" value="N_variables"/>
 #         </dimensions>
 #     </field>
-#     <field name="TRANSFER_MATRIX" type="NX_NUMBER">
+#     <field name="TRANSFER_MATRIX" type="NX_NUMBER" nameType="any">
 #         <doc>
 #             Contains the datastructure which relates beam properties of an
 #             input and output beam as result of the input beam interaction

contributed_definitions/nyaml/NXellipsometry.yaml

@@ -99,23 +99,18 @@ NXellipsometry(NXoptical_spectroscopy):
     ellipsometry_experiment_type:
       doc: |
         Specify the type of ellipsometry.
-      enumeration: [in situ spectroscopic ellipsometry, THz spectroscopic ellipsometry, infrared spectroscopic ellipsometry, ultraviolet spectroscopic ellipsometry, uv-vis spectroscopic ellipsometry, NIR-Vis-UV spectroscopic ellipsometry, other]
-    ellipsometry_experiment_type_other:
-      exists: optional
-      doc: |
-        If the ellipsometry_experiment_type is `other`, a name should be specified here.
+      enumeration:
+        open_enum: true
+        items: [in situ spectroscopic ellipsometry, THz spectroscopic ellipsometry, infrared spectroscopic ellipsometry, ultraviolet spectroscopic ellipsometry, uv-vis spectroscopic ellipsometry, NIR-Vis-UV spectroscopic ellipsometry]
     (NXinstrument):
       doc: |
         Properties of the ellipsometry equipment.
       ellipsometer_type:
         doc: |
           What type of ellipsometry was used? See Fujiwara Table 4.2.
-        enumeration: [rotating analyzer, rotating analyzer with analyzer compensator, rotating analyzer with polarizer compensator, rotating polarizer, rotating compensator on polarizer side, rotating compensator on analyzer side, modulator on polarizer side, modulator on analyzer side, dual compensator, phase modulation, imaging ellipsometry, null ellipsometry, other]
-      ellipsometer_type_other:
-        exists: optional
-        doc: |
-          If the ellipsometer_type is `other`, a specific ellipsometry_type" should be
-          added here.
+        enumeration:
+          open_enum: true
+          items: [rotating analyzer, rotating analyzer with analyzer compensator, rotating analyzer with polarizer compensator, rotating polarizer, rotating compensator on polarizer side, rotating compensator on analyzer side, modulator on polarizer side, modulator on analyzer side, dual compensator, phase modulation, imaging ellipsometry, null ellipsometry]
       rotating_element_type:
         doc: |
           Define which element rotates, e.g. polarizer or analyzer.
@@ -126,7 +121,9 @@ NXellipsometry(NXoptical_spectroscopy):
           If focussing probes (lenses) were used, please state if the data
           were corrected for the window effects.
         type:
-          enumeration: [objective, lens, glass fiber, none, other]
+          enumeration:
+            open_enum: true
+            items: [objective, lens, glass fiber, none]
         device_information(NXfabrication):
           exists: optional
         data_correction(NX_BOOLEAN):
@@ -300,7 +297,7 @@ NXellipsometry(NXoptical_spectroscopy):
             Website of the software.
 
 # ++++++++++++++++++++++++++++++++++ SHA HASH ++++++++++++++++++++++++++++++++++
-# a8265d2e1d81b6a439fa7458646bc18348474ac209d9a48e99bbde2c7fd1f610
+# 0f9d2deae81e2737a54d62a6abc5a74dcd5c49e64d5f4ac0a2a5c51a7bd26c28
 # <?xml version='1.0' encoding='UTF-8'?>
 # <?xml-stylesheet type="text/xsl" href="nxdlformat.xsl"?>
 # <!--
@@ -450,21 +447,15 @@ NXellipsometry(NXoptical_spectroscopy):
 #             <doc>
 #                 Specify the type of ellipsometry.
 #             </doc>
-#             <enumeration>
+#             <enumeration open="true">
 #                 <item value="in situ spectroscopic ellipsometry"/>
 #                 <item value="THz spectroscopic ellipsometry"/>
 #                 <item value="infrared spectroscopic ellipsometry"/>
 #                 <item value="ultraviolet spectroscopic ellipsometry"/>
 #                 <item value="uv-vis spectroscopic ellipsometry"/>
 #                 <item value="NIR-Vis-UV spectroscopic ellipsometry"/>
-#                 <item value="other"/>
 #             </enumeration>
 #         </field>
-#         <field name="ellipsometry_experiment_type_other" optional="true">
-#             <doc>
-#                 If the ellipsometry_experiment_type is `other`, a name should be specified here.
-#             </doc>
-#         </field>
 #         <group type="NXinstrument">
 #             <doc>
 #                 Properties of the ellipsometry equipment.
@@ -473,7 +464,7 @@ NXellipsometry(NXoptical_spectroscopy):
 #                 <doc>
 #                     What type of ellipsometry was used? See Fujiwara Table 4.2.
 #                 </doc>
-#                 <enumeration>
+#                 <enumeration open="true">
 #                     <item value="rotating analyzer"/>
 #                     <item value="rotating analyzer with analyzer compensator"/>
 #                     <item value="rotating analyzer with polarizer compensator"/>
@@ -486,15 +477,8 @@ NXellipsometry(NXoptical_spectroscopy):
 #                     <item value="phase modulation"/>
 #                     <item value="imaging ellipsometry"/>
 #                     <item value="null ellipsometry"/>
-#                     <item value="other"/>
 #                 </enumeration>
 #             </field>
-#             <field name="ellipsometer_type_other" optional="true">
-#                 <doc>
-#                     If the ellipsometer_type is `other`, a specific ellipsometry_type" should be
-#                     added here.
-#                 </doc>
-#             </field>
 #             <field name="rotating_element_type">
 #                 <doc>
 #                     Define which element rotates, e.g. polarizer or analyzer.
@@ -512,12 +496,11 @@ NXellipsometry(NXoptical_spectroscopy):
 #                     were corrected for the window effects.
 #                 </doc>
 #                 <field name="type">
-#                     <enumeration>
+#                     <enumeration open="true">
 #                         <item value="objective"/>
 #                         <item value="lens"/>
 #                         <item value="glass fiber"/>
 #                         <item value="none"/>
-#                         <item value="other"/>
 #                     </enumeration>
 #                 </field>
 #                 <group name="device_information" type="NXfabrication" optional="true"/>

contributed_definitions/nyaml/NXlens_opt.yaml

@@ -125,10 +125,10 @@ NXlens_opt(NXcomponent):
       The numerical aperture of the used incident light optics.
   magnification(NX_FLOAT):
     doc: |
-        
+      Magnification of the lens
 
 # ++++++++++++++++++++++++++++++++++ SHA HASH ++++++++++++++++++++++++++++++++++
-# bcffd0096011eaf96dcd6697460d43f628f62eedeb05543ebb29cfcc3dd19c2e
+# 753405f4ca68fce290b1a52202384ce02af2079fa6d5529da23fea0db7ba5d79
 # <?xml version='1.0' encoding='UTF-8'?>
 # <?xml-stylesheet type="text/xsl" href="nxdlformat.xsl"?>
 # <!--
@@ -321,7 +321,7 @@ NXlens_opt(NXcomponent):
 #     </field>
 #     <field name="magnification" type="NX_FLOAT">
 #         <doc>
-#             
+#             Magnification of the lens
 #         </doc>
 #     </field>
 # </definition>